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- Title
- Spectroscopic Ellipsometers - J.A. Woollam Co.
- Meta Description
- J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.
- Meta Keywords
- ellipsometer applications, ellipsometer, ellipsometry, spectroscopic ellipsometer, SE, multiwavelength ellipsometer, insitu, J. A. Woollam,compensator ellipsometer, CompleteEASE, WVASE32, optical properties, thin film thickness, optical constants, index of refraction